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Additional requirements for the efficient design of high-speed buses may be dictated by the needs of a specific application. For example, a 266 MHz, 64-bit DDR RAM interface will be sensitive to skew between the different byte lanes. Large parallel buses also have the potential to generate simultaneous switching output (SSO) noise and voltage droop. All of these factors translate into the need to manage the transient current demands of a particular application through proper design of the
power distribution system (PDS).

Resistance, Inductance, and Capacitance Pull the Strings

• In general, SI and PI issues arise when designers pay inadequate attention to these
• broad categories:
• Termination schemes
• Skin effect (frequency-dependent attenuation)
• Dielectric losses
• Impedance discontinuities/reflections
• Data coding (DC balanced codes, run length, channel memory)
• Equalization/pre-emphasis
• Inter-symbol interference
• Crosstalk
• Decoupling/bypassing in power distribution
• Board stack-up
• Signal edge rates.

The common denominator in these problems is poor management of the three“bad boys” of electric circuits: resistance, inductance, and capacitance (Figure 1). Inaddition, you must understand and employ the right measurement techniques in the lab to accurately measure and validate designs against simulations or design specifications.

The objective is to build systems right the first time.

Minimize SI/PI Effects

In this special series on signal integrity, we have assembled articles that will provide you with practical and technical resources towards achieving that goal. From characterization and model extraction techniques in the lab to methods for simulating signal degradations of synchronous parallel/asynchronous serial systems to case studies, this series covers many aspects of SI.

In a sidebar to this article, Xilinx Principal Engineer Austin Lesea lists “Ten Reasons Why Performing SI Simulations is a Good Idea.” Although this may sound very familiar to some of you, understanding the benefits of performing SI analysis throughout the design cycle can help you achieve your performance, reliability, and time-to-market goals.

“Interfacing SMA Connectors to Virtex-II Pro MGTs” details Warren Miller and Vince Gavagan’s experience designing the interface between Virtex-II Pro multi-gigabit transceivers (MGTs) and Sub Miniature version A (SMA) connectors for the Virtex-II Pro Aurora Design Kit. Through prototyping and time domain reflectometry (TDR) measurements, they illustrate how SMA connector choice influences signal quality.

Bill Hargin believes that “For Synchronous Signals, Timing Is Everything.” His article outlines a method for extracting correction values that can be applied to the clock-to-out and flight time numbers. The resulting timing values in the datasheet are representative of the actual load and topology of your design. This technique specifically applies to sourcesynchronous links.

Predicting the interconnect performance of high-speed links made of complexvia, connector, and trace structures is no easy task. However, as Ansoft’s Lawrence Williams explains in “Designing High- Speed Interconnects for High-Bandwidth FPGAs,” combining electromagnetic, circuit, and system simulations greatly helps in the design of reliable and fast data transmission channels.

When designing multi-gigabit asynchronous channels, you must carefully analyze the link’s physical and electrical properties. In his article, “Accurate Multi-Gigabit Link Simulation with HSPICE,” Dr. Scott Wedge explains how the combination of an EM solver, coupled transmission lines, Sparameter support, and SPICE and IBIS modeling to the HSPICER circuit simulator helps accurately account for high-speed signal distortions.

With “Eyes Wide Open,” Steve Baker shows you how to use the RocketIO Design Kit for ICX to evaluate pre-layout options (such as placement, connectors, or
stackup) as well as post-layout options (such as detailed routing structures) to achieve high-speed serial link performance.

As much as Xilinx recommends SI simulation and analysis before manufacturing a PCB, there are two very valuable lab instruments that you can use on prototype/exploration boards. With these instruments, you can characterize interconnect properties and high-speed signal behavior, explore different
topology performances, or extract simulation models. In his article, “Backplane Characterization Techniques,” Eric Bogatin explains the need for making measurements, illustrating the concept of measurement and model bandwidth. He also discusses SMA launches, information contained in TDR traces, and differential S-parameters.

In “A Low-Cost Solution for Debugging MGT Designs,” Joel Tan presents a solution comprising a bit-error rate testing module connected to a flexible on-chip logic analyzer core, both implemented in FPGA fabric. Together with the ChipScope Pro software suite, these two components allow you to perform diagnostic testing, debugging, and development of an MGT system without the use of expensive lab equipment such as logic analyzers and BERT testers.

And in “Tolerance Calculations in Power Distribution Networks,” Sun Microsystems’Istvan Novak walks you through different scenarios of bypass capacitor configurations to demonstrate the importance and influence of the capacitors’ technology, value, and number in designing a decoupling/power distribution network.

Conclusion

We hope you will find in this series instructive material on the sources of SI/PI effects, along with practical information about the resources and tools available to you. Our experience tells us that careful simulations, analysis, and measurements of PI and SI effects early in the design process guarantees first-time success more often than not